Susceptibility of electronic systems to high-power microwaves: Summary of test experience

IEEE Transactions on Electromagnetic Compatibility

Volumn 46, Issue 3, 2004, Pages 396-403

  Bäckström, Mats G ^a   Lövstrand, Karl Gunnar ^b  

^a SWEDISH DEFENCE RESEARCH AGENCY   (Sweden)

^b Swed Defence Mat Administration   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE INTERFERENCE; ELECTRONIC EQUIPMENT; EQUIPMENT TESTING; MILITARY EQUIPMENT; PARABOLIC ANTENNAS; TEST FACILITIES;

HIGH POWER MICROWAVES; IMMUNITY TESTING; INTENTIONAL ELECTROMAGNETIC INTERFERENCE; MICROWAVE EFFECTS; RADIATED SUSCEPTIBILITY; SWEDISH MICROWAVE TEST FACILITY;

MICROWAVES;

EID: 4444289299     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2004.831814     Document Type: Article

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