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Volumn , Issue , 2004, Pages 461-464

Improved modeling accuracy of thick metal passive SiGe/BiCMOS components for UWB using ADS momentum

Author keywords

Inductors; Method of moments; On wafer measurements; Simulation software

Indexed keywords

MOMENTUM SIMULATIONS; ON-WAFER MEASUREMENTS; SIMULATION SOFTWARES;

EID: 4444275424     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (5)
  • 1
    • 84862417728 scopus 로고    scopus 로고
    • http://eesof.tm.agilent.com/products/e8921a-a.html
  • 3
    • 0026679924 scopus 로고
    • An improved de-embedding technique for on-wafer high frequency characterization
    • M. C. A. M., Koolen, J. A. M. Geelen, and M. P. J. G. Versleijen, "An improved de-embedding technique for on-wafer high frequency characterization", BCTM Symp. Dig., pp. 188-191, 1991.
    • (1991) BCTM Symp. Dig. , pp. 188-191
    • Koolen, M.C.A.M.1    Geelen, J.A.M.2    Versleijen, M.P.J.G.3
  • 4
    • 0343081380 scopus 로고    scopus 로고
    • Simple accurate expressions for planar spiral inductances
    • October
    • S. S. Mohan et al., "Simple accurate expressions for planar spiral inductances", IEEE J. Solid-State Circuits, vol. 34, pp. 1419-1424, October 1999.
    • (1999) IEEE J. Solid-state Circuits , vol.34 , pp. 1419-1424
    • Mohan, S.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.