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Volumn , Issue , 2004, Pages 461-464
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Improved modeling accuracy of thick metal passive SiGe/BiCMOS components for UWB using ADS momentum
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Author keywords
Inductors; Method of moments; On wafer measurements; Simulation software
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Indexed keywords
MOMENTUM SIMULATIONS;
ON-WAFER MEASUREMENTS;
SIMULATION SOFTWARES;
CIRCUIT OSCILLATIONS;
COMPUTER SIMULATION;
ELECTRIC INDUCTORS;
ELECTROMAGNETIC WAVES;
INDUCTANCE;
MATHEMATICAL MODELS;
METHOD OF MOMENTS;
NATURAL FREQUENCIES;
PASSIVE NETWORKS;
CMOS INTEGRATED CIRCUITS;
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EID: 4444275424
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (5)
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