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Volumn 5, Issue , 2004, Pages 4446-4449

High power electronic device measurements of four IGCTs (4.5kV/4.0kA) in series connection

Author keywords

IGCT; Series connection; Voltage asymmetry

Indexed keywords

SERIES CONNECTION; VOLTAGE ASYMMETRY;

EID: 4444266295     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (12)
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  • 2
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  • 4
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  • 7
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    • A modular concept for the circuit simulation of bipolar power semiconductors
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  • 8
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    • Temperature dependent characterization of silicon power semicondutors - A new model validated by device-internal probing between 400K and 100K
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    • A. Schlögl, T. Mnatsakanov, H. Kuhn and D. Schröder "Temperature Dependent Characterization of Silicon Power Semicondutors - A New Model Validated by Device-Internal Probing between 400K and 100K", Proc. of PESC, Kyoto, 1998
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  • 9
    • 0029748235 scopus 로고    scopus 로고
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  • 10
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  • 11
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.