Study of the correlation between crystal defects and properties of CdTe:Ge radiation detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3182, Issue , 1997, Pages 100-106

  Feichuk, P ^a   Shcherbak, L ^a   Phrta, D ^a   Moravec, P ^b   Franc, J ^b   Belas, E ^b   Hoschl P ^b  

^a CHERNIVTSI NATIONAL UNIVERSITY   (Ukraine)

^b CHARLES UNIVERSITY   (Czech Republic)

Author keywords

Cadmium telluride; Crystal defect structure; Inclusions; Precipitalions; X ray detector

Indexed keywords

CADMIUM; CADMIUM COMPOUNDS; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DEFECT STRUCTURES; DETECTORS; DISLOCATIONS (CRYSTALS); GERMANIUM; MATERIALS SCIENCE; RADIATION DETECTORS; TELLURIUM COMPOUNDS;

CADMIUM TELLURIDE; CRYSTAL DEFECT STRUCTURE; DETECTOR PARAMETERS; DOPED CRYSTALS; HIGH RESISTIVITIES; PRECIPITALIONS; RADIOMETRIC ANALYSES; X-RAY DETECTOR;

CRYSTAL DEFECTS;

EID: 4444256268     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.280410     Document Type: Conference Paper

References (8)

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