Surface characterization of plasma-treated PTFE surfaces: An OES, XPS and contact angle study

Surface and Interface Analysis

Volumn 36, Issue 8, 2004, Pages 1027-1031

  Vandencasteele, N ^a   Reniers, F ^a  

^a UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

Author keywords

Nitrogen plasma; PTFE; XPS

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRONS; INTERFACIAL ENERGY; PLASMAS; POSITIVE IONS; SECONDARY ION MASS SPECTROMETRY; SURFACE CHEMISTRY; SURFACE TREATMENT; ULTRAVIOLET RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

NEUTRAL ATOMS; NITROGEN PLASMA; SURFACE CHRACTERIZATION; WATER CONTACT ANGLE;

POLYTETRAFLUOROETHYLENES;

EID: 4444252192     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1829     Document Type: Conference Paper

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