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Volumn 1998-September, Issue , 1998, Pages 299-304

Correlation of thermo-mechanical properties of adhesives with reliability of FC interconnections

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE JOINTS; ADHESIVES; ANISOTROPY; COATINGS; CONDUCTIVE MATERIALS; CURING; ELECTRONICS PACKAGING; FLIP CHIP DEVICES; JOINING; MECHANICAL PROPERTIES; RELIABILITY;

EID: 4444245537     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ADHES.1998.742045     Document Type: Conference Paper
Times cited : (5)

References (7)
  • 1
    • 85051930963 scopus 로고    scopus 로고
    • Current-Induced Degradation of Isotropically Conductive Adhesives
    • S. Kotthaus et al.: Current-Induced Degradation of Isotropically Conductive Adhesives", PEP'97 Proceedings.
    • PEP'97 Proceedings
    • Kotthaus, S.1
  • 2
    • 85044599596 scopus 로고    scopus 로고
    • Fundamental study of electrically conductive adhesives
    • C.P. Wong et al.: Fundamental Study of Electrically Conductive Adhesives". PEP'97 Proceedings.
    • PEP'97 Proceedings
    • Wong, C.P.1
  • 3
    • 85044592922 scopus 로고    scopus 로고
    • Evaluation of Adhesive Flip Chip Bonding on Flexible Substrates
    • R. Aschenbrenner et al.: Evaluation of Adhesive Flip Chip Bonding on Flexible Substrates". Flexcon'9 Proceedings.
    • Flexcon'9 Proceedings
    • Aschenbrenner, R.1
  • 4
    • 85051932042 scopus 로고    scopus 로고
    • Thermo-mechanical reliability of flip-chip structures used in DCA and CSP
    • March 15-18. Braselton GA
    • A. Schubert: Thermo-Mechanical Reliability of Flip-Chip Structures Used in DCA and CSP". Advanced Packaging Materials, March 15-18. Braselton GA
    • Advanced Packaging Materials
    • Schubert, A.1
  • 5
    • 85044621622 scopus 로고    scopus 로고
    • Influences on the Reliability of Underfilled Flip Chips
    • K.-F. Becker et al.: Influences on the Reliability of Underfilled Flip Chips", ITAP:97 Proceedings
    • ITAP:97 Proceedings
    • Becker, K.-F.1
  • 6
    • 0030652173 scopus 로고    scopus 로고
    • Development of low cost and reliable resin based press contact technology
    • R. Yoshino et al.: .,Development of Low Cost and Reliable Resin Based Press Contact Technology". IEMT/EMC Proceedings 1997.
    • (1997) IEMT/EMC Proceedings
    • Yoshino, R.1
  • 7
    • 0011732571 scopus 로고
    • Springer-Verlag. Berlin. New York
    • G. Habenicht: .,Kleben". Springer-Verlag. Berlin. New York, 1990.
    • (1990) Kleben
    • Habenicht, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.