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Volumn 2, Issue , 2004, Pages 368-376

Design optimization and reliability of PWB level electronic package

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC PRODUCTS; THERMAL CYCLE LOADING; THERMAL MANAGEMENT STRATEGIES;

EID: 4444243424     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (18)

References (11)
  • 3
    • 0036240551 scopus 로고    scopus 로고
    • Optimization modeling for flip-chip solder joint reliability
    • Stoyanov, S., Bailey, C. and Cross, m., "Optimization Modeling for flip-chip Solder Joint Reliability", Soldering & Surface Mount Technology, Vol. 14, No 1 (2002) pp-746-760
    • (2002) Soldering & Surface Mount Technology , vol.14 , Issue.1 , pp. 746-760
    • Stoyanov, S.1    Bailey, C.2    Cross, M.3
  • 6
    • 0001784769 scopus 로고
    • Reliability of plastic ball grid array assembly
    • J. Lau, ed., McGraw-Hill, Inc. New York
    • Darveaux, R., Banerji, K., Mawer, A., and Dody, G., "Reliability of Plastic Ball Grid Array Assembly," Ball Grid Array Technology, J. Lau, ed., McGraw-Hill, Inc. New York, 1995, pp. 379-442.
    • (1995) Ball Grid Array Technology , pp. 379-442
    • Darveaux, R.1    Banerji, K.2    Mawer, A.3    Dody, G.4
  • 7
    • 0022218769 scopus 로고
    • Constitutive equations for the hot working of metals
    • Anand, L., "Constitutive Equations for the Hot Working of Metals", I. Journal of Plasticity 1985.
    • (1985) I. Journal of Plasticity
    • Anand, L.1
  • 9
    • 0038480111 scopus 로고    scopus 로고
    • Effect of simulation methodology on solder joint crack growth correlation and fatigue life prediction
    • Darveaux, R., "Effect of Simulation Methodology on Solder Joint Crack Growth Correlation and Fatigue Life Prediction", J. of E. Packaging. 124, 147, 2002.
    • (2002) J. of E. Packaging , vol.124 , pp. 147
    • Darveaux, R.1
  • 10
    • 1442356081 scopus 로고    scopus 로고
    • Analytically intractable failure events
    • Lulu, M., Magsoodloo, S. (2003). Analytically Intractable Failure Events. Quality Engineering. 16(2), pp. 283-288.
    • (2003) Quality Engineering , vol.16 , Issue.2 , pp. 283-288
    • Lulu, M.1    Magsoodloo, S.2
  • 11
    • 0004075496 scopus 로고    scopus 로고
    • Designing quality and reliability into circuits
    • Lulu, M. (1996). Designing Quality and Reliability into Circuits. Quality Engineering, pp. 383-393.
    • (1996) Quality Engineering , pp. 383-393
    • Lulu, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.