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Volumn 40, Issue 4 II, 2004, Pages 2101-2103

Multiresolution analysis for reconstruction of conductivity profiles in eddy current nondestructive evaluation using probe impedance data

(3) Shao, K R a Guo, YouGuang b Lavers, J D c

a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (China)

b UNIVERSITY OF TECHNOLOGY SYDNEY (Australia)

c UNIVERSITY OF TORONTO (Canada)

Author keywords

Eddy current testing; Inverse problems; Multiresolution analysis; Probe impedance change

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; CONDUCTIVE MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; GREEN'S FUNCTION; INTEGRAL EQUATIONS; INVERSE PROBLEMS; MATHEMATICAL MODELS; PERTURBATION TECHNIQUES; PROBES; PROBLEM SOLVING; SIGNAL PROCESSING; TENSORS;

CURRENT DIPOLE DENSITY; MULTIRESOLUTION ANALYSIS; PROBE IMPEDANCE CHANGE; WAVELET FUNCTIONS;

EDDY CURRENT TESTING;

EID: 4444239129 PISSN: 00189464 EISSN: None Source Type: Journal
DOI: 10.1109/TMAG.2004.832264 Document Type: Article

Times cited : (9)

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