NiAl seed layer for obliquely sputtered thin-film tape

IEEE Transactions on Magnetics

Volumn 40, Issue 4 II, 2004, Pages 2401-2403

  Nguyen, L T ^a   Hozoi, A ^a   Lodder, J C ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Oblique sputtering; Recording tape; Underlayer

Indexed keywords

ALUMINUM; FILM GROWTH; GRAIN SIZE AND SHAPE; MAGNETIC RECORDING; MICROSTRUCTURE; NICKEL; SPUTTERING; X RAY DIFFRACTION;

OBLIQUE SPUTTERING; RECORDING TAPE; UNDERLAYERS;

THIN FILMS;

EID: 4444230568     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.829816     Document Type: Article

References (6)

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