Surface and depth profile analysis of insulating samples by TOF-SIMS

Glass Science and Technology

Volumn 77, Issue 4, 2004, Pages 159-165

  Anderson, Olaf ^a   Scheumann, Volker ^a   Rothhaar, Uwe ^a   Rupertus, Volker ^a  

^a SCHOTT AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL MATRICES; ION IMAGES; ORGANIC FUNCTIONAL COATINGS;

COATINGS; CORROSION RESISTANCE; DIFFUSION; GEOMETRY; INSULATING MATERIALS; OPTIMIZATION; SECONDARY ION MASS SPECTROMETRY; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY;

GLASS CERAMICS;

EID: 4444229044     PISSN: 09467475     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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