Study of the effect of different aluminium surface pretreatments on the deposition of thin non-functional silane coatings

Surface and Interface Analysis

Volumn 36, Issue 8, 2004, Pages 681-684

  Franquet, A ^a   Terryn, H ^a   Vereecken, J ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

AES; Aluminium pretreatment; Infrared spectroscopic ellipsometry; SEM; Silane film formation; Spectroscopic ellipsometry

Indexed keywords

ALUMINIUM PRETREATMENT; INFRARED SPECTROSCOPIC ELLIPSOMETRY; SILANE FILM FORMATIONS; SPECTROSCOPIC ELLIPSOMETRY;

COATINGS; CURRENT DENSITY; ELLIPSOMETRY; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS;

SILANES;

EID: 4444222536     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1735     Document Type: Conference Paper

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