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Volumn 9, Issue 9, 1997, Pages 1967-1982

High-resolution inverted x-ray photoelectron diffraction studies of Si(100)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 4444220270     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/9/9/011     Document Type: Article
Times cited : (4)

References (42)
  • 35
    • 5644298806 scopus 로고    scopus 로고
    • private communication
    • Parry D E 1996 private communication
    • (1996)
    • Parry, D.E.1
  • 42
    • 5644272808 scopus 로고
    • ed D B Holt, M D Muir, P R Grant and I M Boswarva (London: Academic)
    • Gedcke D A 1974 Quantitative Scanning Electron Microscopy ed D B Holt, M D Muir, P R Grant and I M Boswarva (London: Academic) p 422
    • (1974) Quantitative Scanning Electron Microscopy , pp. 422
    • Gedcke, D.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.