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Volumn 178, Issue 12, 2008, Pages 915-923
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Electromagnetic particle-in-cell simulations on magnetic reconnection with adaptive mesh refinement
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Author keywords
3D model; Adaptive mesh refinement; EM PIC model; Magnetic reconnection
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Indexed keywords
COMPUTER SIMULATION;
DEBYE TEMPERATURE;
ELECTRONIC STRUCTURE;
GAIN MEASUREMENT;
SEMICONDUCTOR DEVICE MODELS;
ADAPTIVE MESH REFINEMENT (AMR);
DEBYE LENGTH;
EM-PIC MODEL;
MAGNETIC RECONNECTION;
MAGNETIC STRUCTURE;
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EID: 44349185652
PISSN: 00104655
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cpc.2008.02.010 Document Type: Article |
Times cited : (23)
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References (16)
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