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Volumn 45, Issue 3, 2008, Pages 120-125

Conductivity measurements as a method for studying ionic technical grade surfactants

Author keywords

Critical micelle concentration; Degree of micelle ionization; Ionic technical grade surfactant; Specific conductivity; Surface tension

Indexed keywords

ANIONIC SURFACTANTS; CRITICAL MICELLE CONCENTRATION; ELECTRIC CONDUCTIVITY MEASUREMENT; IMPURITIES; IONIZATION; SURFACE TENSION;

EID: 44349133285     PISSN: 09323414     EISSN: None     Source Type: Journal    
DOI: 10.3139/113.100368     Document Type: Article
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.