On the orientations of abnormally grown grains in nanocrystalline Ni and Ni-Fe

Journal of Microscopy

Volumn 230, Issue 3, 2008, Pages 455-463

  Klement, U ^a   Da Silva, M ^a   Skrotzki, W ^b  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Abnormal grain growth; EBSD; Nanocrystalline material; Ni and Ni Fe; Twinning

Indexed keywords

ANNEALING; BINARY ALLOYS; GRAIN GROWTH; IRON ALLOYS; NANOCRYSTALLINE ALLOYS; NICKEL; SCANNING ELECTRON MICROSCOPY;

ABNORMAL GRAIN GROWTH; ANNEALING TWINS; DOMINANT ORIENTATION; EBSD; ELECTRON BACKSCATTER DIFFRACTION TECHNIQUE; GRAIN ORIENTATION; NANOCRYSTALLINE NI; NI AND NI-FE; NORMAL DIRECTION; ORIENTATION CHANGES;

NANOCRYSTALS;

IRON; NANOCRYSTAL; NICKEL;

CONFERENCE PAPER; CRYSTALLIZATION; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON DIFFRACTION; IMAGE ANALYSIS; MATERIALS; MEASUREMENT; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 44349121343     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.02005.x     Document Type: Conference Paper

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