Electron-beam-induced modification of PbSnTe surface morphology under HEED monitoring of MBE growth

Russian Microelectronics

Volumn 37, Issue 3, 2008, Pages 146-156

  Borynyak, L A ^a   Velichko, A A ^a   Ilyushin, V A ^a   Ostertak, D I ^a   Peisakhovich, Yu G ^a   Filimonova, N I ^a  

^a NOVOSIBIRSK STATE TECHNICAL UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER LAYERS; ELECTRON BEAMS; MOLECULAR BEAM EPITAXY; SUBSTRATES; SURFACE MORPHOLOGY; SURFACE TREATMENT;

ELECTRON BEAM EFFECTS; GROWTH MONITORING; SUBSTRATE GROWTH;

FILM GROWTH;

EID: 44349111757     PISSN: 10637397     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063739708030025     Document Type: Article

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