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Volumn 44, Issue 1, 2008, Pages 90-101
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Mapping of the quantitative trait loci (QTL) associated with grain quality characteristics of the common wheat grown under different environmental conditions
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
CEREAL;
GENETICS;
GROWTH, DEVELOPMENT AND AGING;
PLANT CHROMOSOME;
QUANTITATIVE TRAIT LOCUS;
WHEAT;
CEREALS;
CHROMOSOMES, PLANT;
QUANTITATIVE TRAIT LOCI;
TRITICUM;
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EID: 44349090830
PISSN: 00166758
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (6)
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References (0)
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