Magnetic and dielectric properties of Yb(Mn1-xAl x)O3 thin films

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 55, Issue 5, 2008, Pages 1056-1060

  Fukae, Keisuke ^a   Takahashi, Tetsuya ^a   Yoshimura, Takeshi ^a   Fujimura, Norifumi ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; FERROMAGNETISM; MAGNETIC PROPERTIES; YTTERBIUM COMPOUNDS;

MULTIFERROIC MATERIALS; NONMAGNETIC ELEMENTS;

EPITAXIAL FILMS;

ARTICLE; ARTIFICIAL MEMBRANE; CERAMICS; CHEMISTRY; CRYSTALLIZATION; IMPEDANCE; MAGNETISM; MATERIALS TESTING; METHODOLOGY;

CERAMICS; CRYSTALLIZATION; ELECTRIC IMPEDANCE; MAGNETICS; MATERIALS TESTING; MEMBRANES, ARTIFICIAL;

EID: 44249115346     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2008.756     Document Type: Conference Paper

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