Microwave dielectric properties of (A2+ 1/3B5+ 2/3)0.5Ti0.5O2 (A2+ = Zn, Mg, B5+ = Nb, Ta) ceramics

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 55, Issue 5, 2008, Pages 1069-1074

  Kim, Eung Soo ^a   Kang, Dong Ho ^a  

^a Kyonggi University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVES; NATURAL FREQUENCIES; OXYGEN; PERMITTIVITY;

OXYGEN OCTAHEDRAL DISTORTION; QUALITY FACTORS (QF);

CERAMIC MATERIALS;

ARTICLE; CERAMICS; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; CRYSTALLIZATION; IMPEDANCE; MATERIALS TESTING; METHODOLOGY; MICROWAVE RADIATION;

CERAMICS; COMPUTER SIMULATION; CRYSTALLIZATION; ELECTRIC IMPEDANCE; MATERIALS TESTING; MICROWAVES; MODELS, CHEMICAL;

EID: 44249113325     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2008.758     Document Type: Conference Paper

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