Crystal structure and dielectric properties of Ca0.85Nd 0.1TiO3 - LnAlO3 ceramics

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 55, Issue 5, 2008, Pages 1075-1080

  Kim, Eung S ^a   Kang, Dong H ^a   Yang, Jun Mo ^b   Shin, Hyung S ^c   Zahari, Nur I ^d   Ohsato, Hitoshi ^d  

^a Kyonggi University   (South Korea)

^b National Nanofabrication Center   (South Korea)

^c Kaya University   (South Korea)

^d NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DIELECTRIC PROPERTIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROWAVES; X RAY DIFFRACTION ANALYSIS;

IONIC RADIUS; OXYGEN OCTAHEDRAL DISTORTION; QUALITY FACTOR (QF);

CALCIUM COMPOUNDS;

ARTICLE; ARTIFICIAL MEMBRANE; CERAMICS; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; MATERIALS TESTING; METHODOLOGY;

CERAMICS; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MOLECULAR CONFORMATION;

EID: 44249095343     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2008.759     Document Type: Conference Paper

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