Mean values for homogeneous stit tessellations in 3D

Image Analysis and Stereology

Volumn 27, Issue 1, 2008, Pages 29-37

  Nagel, Werner ^a   Weiss, Viola ^b  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b UNIVERSITY OF APPLIED SCIENCES JENA   (Germany)

Author keywords

Crack pattern; Mean values; Random tessellations; Spatial statistics; Stochastic geometry

Indexed keywords

EID: 44149116236     PISSN: 15803139     EISSN: 18545165     Source Type: Journal    
DOI: 10.5566/ias.v27.p29-37     Document Type: Article

References (11)