Optical and structural properties of SiC nanocrystals

Journal of Materials Science: Materials in Electronics

Volumn 19, Issue 8-9, 2008, Pages 682-686

  Morales Rodriguez, M ^a   Diaz Cano A ^b   Torchynska, T V ^b   Palacios Gomez, J ^b   Gomez Gasga, G ^b   Polupan, G ^b   Mynbaeva, M ^c  

^a UNIVERSIDAD AUTÓNOMA METROPOLITANA AZCAPOTZALCO   (Mexico)

^b INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^c IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EXCITONS; NANOCRYSTALS; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; STRUCTURAL PROPERTIES; SURFACE DEFECTS; X RAY DIFFRACTION ANALYSIS;

ELECTRON-HOLE CONFINEMENT; EXCITONS RECOMBINATION RATE; SILICON CARBIDE NANOCRYSTALS;

SILICON CARBIDE;

EID: 44149111870     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-007-9379-1     Document Type: Conference Paper

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