Structural, ferroelectric, ferromagnetic, and magnetoelectric properties of the lead-free Bi3.15Nd0.85Ti3O12/CoFe2O4 double-layered thin film

Journal of Crystal Growth

Volumn 310, Issue 12, 2008, Pages 2995-2998

  Zhong, X L ^a   Liao, M ^a   Wang, J B ^a   Xie, S H ^a   Zhou, Y C ^a  

^a XIANGTAN UNIVERSITY   (China)

Author keywords

A3. Chemical solution deposition; B1. Composite films; B2. Magnetoelectric properties

Indexed keywords

DEPOSITION; FERROELECTRICITY; MAGNETOELECTRIC EFFECTS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR GROWTH;

CHEMICAL SOLUTION DEPOSITION; DOUBLE-LAYERED THIN FILMS; MAGNETOELECTRIC PROPERTIES; ROOM TEMPERATURE;

COMPOSITE FILMS;

EID: 44149110579     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2008.02.031     Document Type: Article

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