Characterization of JEOL 2100F Lorentz-TEM for low-magnification electron holography and magnetic imaging

Ultramicroscopy

Volumn 108, Issue 7, 2008, Pages 625-634

  Schofield, M A ^a   Beleggia, M ^a   Zhu, Y ^a   Pozzi, G ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Electron holography; Lorentz microscopy; Magnetic imaging; Transmission electron microscopy

Indexed keywords

ELECTRON HOLOGRAPHY; HOLOGRAMS; IMAGING SYSTEMS; MAGNETIC MATERIALS; OPTIMIZATION; TRANSMISSION ELECTRON MICROSCOPY;

FRINGES; LORENTZ MICROSCOPY; MAGNETIC IMAGING;

MICROSCOPES;

ARTICLE; ELECTRON MICROSCOPE; HOLOGRAPHY; IMAGING SYSTEM; MATHEMATICAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPE; TRANSMISSION ELECTRON MICROSCOPY;

HOLOGRAPHY; LENSES; MAGNETICS; MICROSCOPY, ELECTRON, TRANSMISSION;

EID: 44149097802     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.10.015     Document Type: Article

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