Locating the normal to relaxor phase boundary in Ba(Ti1-xHfx)O3 ceramics

Materials Research Bulletin

Volumn 43, Issue 7, 2008, Pages 1761-1769

  Anwar, Shahid ^a   Sagdeo, P R ^a   Lalla, N P ^a  

^a UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

C. X ray diffraction (XRD)

Indexed keywords

BARIUM COMPOUNDS; CONCENTRATION (PROCESS); HAFNIUM; PERMITTIVITY; PHASE BOUNDARIES; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION;

FERROELECTRIC PHASE TRANSITION; PHENOMENOLOGICAL MODELS;

CERAMIC MATERIALS;

EID: 44049083863     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2007.07.013     Document Type: Article

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