Relationship between microstructure and optical properties in high Tc superconductors

Thin Solid Films

Volumn 234, Issue 1-2, 1993, Pages 508-511

  Babonas, G J ^a   Dagys, R ^a   Kregzd V ^a   Pukinskas, G ^a   Belokoneva, E ^b   Leonyuk, L ^b   Vetkin, A ^b  

^a CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CORRELATION METHODS; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; ELLIPSOMETRY; MICROSTRUCTURE; OPTICAL PROPERTIES; SPECTROSCOPY; SPECTRUM ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

OXYGEN VACANCIES; SPECTROSCOPIC ELLIPSOMETRY; X RAY DIFFRACTION;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 43949166016     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(93)90319-K     Document Type: Article

References (9)

1. Anisotropy of the dielectric function in YBa2Cu3O6