Phase transformation and RT characteristics of vacuum annealed vanadium oxide thin films

Surface Review and Letters

Volumn 15, Issue 1-2, 2008, Pages 59-64

  Wang, Y L ^a   Li, M C ^a   Zhao, L C ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

phase; temperature coefficient of resistance (TCR); vacuum annealing; Vanadium oxide

Indexed keywords

ANNEALING; OXIDE FILMS; PHASE TRANSITIONS; VANADIUM COMPOUNDS;

TEMPERATURE COEFFICIENT OF RESISTANCE (TCR); VACUUM ANNEALING;

THIN FILMS;

EID: 43949125840     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0218625x08010956     Document Type: Conference Paper

References (8)