Trace explosive detection using photothermal deflection spectroscopy

Journal of Applied Physics

Volumn 103, Issue 9, 2008, Pages

  Krause, Adam R ^a,b   Van Neste, Charles ^a,b   Senesac, Larry ^a,b   Thundat, Thomas ^a,b   Finot, Eric ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF TENNESSEE   (United States)

^c LABORATOIRE INTERDISCIPLINAIRE CARNOT DE BOURGOGNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; EXPLOSIVES; FREQUENCY SHIFT KEYING; NATURAL FREQUENCIES; SPECTROSCOPIC ANALYSIS;

BIMATERIAL MICROCANTILEVERS; MICROCANTILEVERS; PHOTOTHERMAL DEFLECTION SPECTROSCOPY; VAPOR PHASE ADSORBED EXPLOSIVES;

CHEMICAL SENSORS;

EID: 43949097914     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2908181     Document Type: Article

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