A CMOS IR-UWB transceiver design for contact-less chip testing applications

IEEE Transactions on Circuits and Systems II: Express Briefs

Volumn 55, Issue 4, 2008, Pages 334-338

  Wang, Yanjie ^a,b   Niknejad, Ali M ^a   Gaudet, Vincent ^b   Iniewski, Kris ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF ALBERTA   (Canada)

^c CMOS Emerging Technologies Inc   (Canada)

Author keywords

CMOS; Impulse radio (IR); On off keying (OOK); Ultra wide band (UWB); Wireless interconnect

Indexed keywords

BROADBAND NETWORKS; CMOS INTEGRATED CIRCUITS; DATA COMMUNICATION SYSTEMS; LOW NOISE AMPLIFIERS; WIRELESS NETWORKS;

IMPULSE RADIO (IR); ON-OFF KEYING (OOK); ULTRA-WIDE-BAND (UWB);

TRANSCEIVERS;

EID: 43849094017     PISSN: 15497747     EISSN: 15583791     Source Type: Journal    
DOI: 10.1109/TCSII.2008.919502     Document Type: Article

References (14)