Structural study of thin films prepared from tungstate glass matrix by Raman and X-ray absorption spectroscopy

Applied Surface Science

Volumn 254, Issue 17, 2008, Pages 5552-5556

  Montanari, Bianca ^a   Barbosa, Anne J ^a   Ribeiro, Sidney J L ^a   Messaddeq, Younes ^a   Poirier, Gaël ^b   Li, Máximo S ^c  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b FEDERAL UNIVERSITY OF ALFENAS   (Brazil)

^c UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Glass; Thin film; Tungsten

Indexed keywords

CHEMICAL BONDS; RAMAN SPECTROSCOPY; TERNARY SYSTEMS; TUNGSTEN; X RAY ABSORPTION SPECTROSCOPY;

BRIDGING BONDS; ELECTRON BEAM EVAPORATION; RAMAN ABSORPTION;

THIN FILMS;

EID: 43849093700     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.02.107     Document Type: Article

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