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Volumn , Issue , 2006, Pages 261-264

Robust sense amplifier design under random dopant fluctuations in nano-scale CMOS technologies

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); COMPUTER SIMULATION; FAILURE ANALYSIS; LOGIC DESIGN; PROBABILITY; THRESHOLD VOLTAGE;

EID: 43749097009     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SOCC.2006.283894     Document Type: Conference Paper
Times cited : (22)

References (5)
  • 1
    • 0035308547 scopus 로고    scopus 로고
    • The impact of intrinsic device fluctuations on CMOS SRAM cell stability
    • April
    • A.J. Bhavnagarwala, et. al., "The impact of intrinsic device fluctuations on CMOS SRAM cell stability," IEEE JSSC, vol. 36, pp. 658-665, April 2001.
    • (2001) IEEE JSSC , vol.36 , pp. 658-665
    • Bhavnagarwala, A.J.1    et., al.2
  • 2
    • 3042778488 scopus 로고    scopus 로고
    • Yield and speed optimization of a latch-type voltage sense amplifier
    • July
    • B. Wicht, et al., "Yield and speed optimization of a latch-type voltage sense amplifier," JSSC, vol. 39, pp. 1148-1158, July 2004.
    • (2004) JSSC , vol.39 , pp. 1148-1158
    • Wicht, B.1
  • 3
    • 0027576335 scopus 로고
    • A current-controlled latch sense amplifier and a static power-saving input buffer for low-power architecture
    • Apr
    • T. Kobayashi et. al., "A current-controlled latch sense amplifier and a static power-saving input buffer for low-power architecture," IEEE J. Solid-State Circuits, vol.28, pp.523-527, Apr 1993
    • (1993) IEEE J. Solid-State Circuits , vol.28 , pp. 523-527
    • Kobayashi, T.1    et., al.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.