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Volumn , Issue , 2006, Pages 261-264
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Robust sense amplifier design under random dopant fluctuations in nano-scale CMOS technologies
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Author keywords
[No Author keywords available]
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Indexed keywords
AMPLIFIERS (ELECTRONIC);
COMPUTER SIMULATION;
FAILURE ANALYSIS;
LOGIC DESIGN;
PROBABILITY;
THRESHOLD VOLTAGE;
AMPLIFIER CIRCUITS;
SCALED TECHNOLOGIES;
TRANSISTOR CHARACTERISTICS;
CMOS INTEGRATED CIRCUITS;
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EID: 43749097009
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SOCC.2006.283894 Document Type: Conference Paper |
Times cited : (22)
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References (5)
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