Nanostructural palladium films for sensor applications

Vacuum

Volumn 82, Issue 10, 2008, Pages 956-961

  Kozlowski M ^a,b   Diduszko, R ^a   Olszewska, K ^a   Wronka, H ^a   Czerwosz, E ^a  

^a TELE AND RADIO RESEARCH INSTITUTE   (Poland)

^b INSTITUTE OF PHYSICS   (Poland)

Author keywords

Nanocrystals; PVD; Standard roughness; Thermal treatment

Indexed keywords

FULLERENES; PALLADIUM COMPOUNDS; PHYSICAL VAPOR DEPOSITION; VOLATILE ORGANIC COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

NANOSTRUCTURAL PALLADIUM FILMS; SENSOR APPLICATIONS; STANDARD ROUGHNESS;

COMPOSITE FILMS;

EID: 43649106895     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2008.01.035     Document Type: Article

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