Statistic analysis of millions of digital photos

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6817, Issue , 2008, Pages

  Wueller, Dietmar ^a   Fageth, Reiner ^b  

^a Image Engineering Dietmar Wueller   (Germany)

^b CeWe Color AG and Co OHG   (Germany)

Author keywords

EXIF; Exposure value; Image analysis; Image quality; Meta data

Indexed keywords

IMAGE QUALITY; IMAGE RESOLUTION; METADATA; PHOTOGRAPHY; SERVERS;

DIGITAL PHOTOGRAPHY; EXPOSURE VALUES;

IMAGE ANALYSIS;

EID: 43649093874     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.766702     Document Type: Conference Paper

References (2)

1. JEITA, Exif 2.2, http://www.exif.org/specifications.html.
2. DIN 19010 Lichtelektrische Belichtungsmesser, Beuth Verlag, Berlin