Relevance of the calculated parameters PD-defect specific risk and PD-identification confidence for risk assessment in GIS

Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials

Volumn , Issue , 2006, Pages 179-182

  Aschenbrenner, D ^a   Dreisbusch, K ^a   Kranz, H G ^a  

^a UNIVERSITY OF WUPPERTAL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRIC INSULATION; PARAMETER ESTIMATION; PROBABILITY; RISK ASSESSMENT; VOLTAGE CONTROL;

IDENTIFICATION SYSTEMS; OVERVOLTAGE DEPENDENCIES; RISK FACTORS;

GEOGRAPHIC INFORMATION SYSTEMS;

EID: 43649090275     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPADM.2006.284147     Document Type: Conference Paper

References (5)