The effect of electrical stressing history on the slow polarization of nano-SiOx and low-density polyethylene composite

Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials

Volumn , Issue , 2006, Pages 903-907

  Li, Zhe ^a   Yin, Yi ^a   Dong, Xiaobing ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Electrical stressing history; Low density polyethylene; Nano SiOx; Nanocomposite; Slow polarization

Indexed keywords

DIELECTRIC LOSSES; ELECTRIC DISCHARGES; LOW DENSITY POLYETHYLENES; NANOCOMPOSITES; TIME DOMAIN ANALYSIS;

DISCHARGING CURRENTS; ELECTRICAL STRESSING; SLOW POLARIZATION;

ELECTROMAGNETIC WAVE POLARIZATION;

EID: 43649084597     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPADM.2006.284323     Document Type: Conference Paper

References (8)