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Volumn 51, Issue 1, 2008, Pages 1-16

Construction and analysis of educational tests using abductive machine learning

Author keywords

Abductive machine learning; Abductive networks; Educational measurements; Item response theory; Neural networks; Optimal test design; Test analysis; Test construction

Indexed keywords

COMPUTATIONAL COMPLEXITY; EDUCATION; MATHEMATICAL PROGRAMMING; NEURAL NETWORKS;

EID: 43549126867     PISSN: 03601315     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.compedu.2007.03.003     Document Type: Article
Times cited : (35)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.