In-chip configuration for monitoring power consumption in micro-processing systems

Proceedings of the Third Workshop - 2005 IEEE Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, IDAACS 2005

Volumn , Issue , 2005, Pages 156-161

  Konstantakos, V ^a   Kosmatopoulos, K ^a   Nikolaidis, S ^a   Laopoulos, Th ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

Built in testing structures; Current measurement; Embedded systems; Low power circuits

Indexed keywords

BUILT-IN SELF TEST; ELECTRIC CURRENT MEASUREMENT; ELECTRIC POWER UTILIZATION; EMBEDDED SYSTEMS; INTEGRATED CIRCUIT MANUFACTURE;

CLOCK CYCLES; CURRENT SENSING; LOW POWER CIRCUITS;

MICROPROCESSOR CHIPS;

EID: 43549125809     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IDAACS.2005.282962     Document Type: Conference Paper

References (10)