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Volumn 459, Issue 1-2, 2008, Pages 298-301

Direct synthesis and characterization of single-phase tantalum nitride (Ta2N) nanocrystallites by dc arc discharge

Author keywords

Nanostructures; Nitride materials; Ta2N; X ray diffraction

Indexed keywords

GROWTH (MATERIALS); NITRIDES; SYNTHESIS (CHEMICAL); TANTALUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

EID: 43549119994     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2007.04.219     Document Type: Article
Times cited : (12)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.