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Volumn 459, Issue 1-2, 2008, Pages 298-301
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Direct synthesis and characterization of single-phase tantalum nitride (Ta2N) nanocrystallites by dc arc discharge
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Author keywords
Nanostructures; Nitride materials; Ta2N; X ray diffraction
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Indexed keywords
GROWTH (MATERIALS);
NITRIDES;
SYNTHESIS (CHEMICAL);
TANTALUM COMPOUNDS;
X RAY DIFFRACTION ANALYSIS;
MASS PRODUCTION;
NITRIDE MATERIALS;
TANTALUM NITRIDE;
NANOSTRUCTURES;
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EID: 43549119994
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2007.04.219 Document Type: Article |
Times cited : (12)
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References (21)
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