Thickness dependences of phase change and channel current control in phase-change channel transistor

2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC

Volumn , Issue , 2005, Pages 617-620

  Yin, Y ^a   Miyachi, A ^a   Niida, D ^a   Sone, H ^a   Hosaka, S ^a  

^a GUNMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRIC RESISTANCE; JOULE HEATING; SEMICONDUCTING GERMANIUM COMPOUNDS; TRANSISTORS;

CHANNEL CURRENT CONTROL; CRYSTALLINE STATE; DRAIN-SOURCE RESISTANCE; ULTRATHIN CHANNEL;

PHASE CHANGE MATERIALS;

EID: 43549118685     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EDSSC.2005.1635349     Document Type: Conference Paper

References (6)