Reliability assessment to large-scale power grid based on small-world topological model

2006 International Conference on Power System Technology, POWERCON2006

Volumn , Issue , 2006, Pages

  Ding, Ming ^a   Han, Pingping ^a  

^a HEFEI UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Cascading reactions; Reliability; Small world effects; Topological analysis

Indexed keywords

COMPUTER SIMULATION; ELECTRIC POWER SYSTEMS; GRID COMPUTING; RANDOM PROCESSES; RELIABILITY THEORY; TOPOLOGY;

CASCADING REACTIONS; POWER GRID; SMALL-WORLD EFFECTS; TOPOLOGICAL ANALYSIS;

LARGE SCALE SYSTEMS;

EID: 43549116369     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPST.2006.321525     Document Type: Conference Paper

References (12)