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Volumn 73, Issue 3, 2008, Pages
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Incorporating topography into 2D resistivity modeling using finite-element and finite-difference approaches
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CONDUCTIVITY;
FINITE DIFFERENCE METHOD;
FINITE ELEMENT METHOD;
POISSON EQUATION;
TOPOGRAPHY;
TOPOGRAPHIC EFFECTS;
TRIANGULAR DISCRETIZATION;
VARYING SURFACE GEOMETRY;
GEOMORPHOLOGY;
ALGORITHM;
ELECTRICAL RESISTIVITY;
FINITE DIFFERENCE METHOD;
FINITE ELEMENT METHOD;
GEOMETRY;
POISSON RATIO;
TOPOGRAPHY;
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EID: 43549110278
PISSN: 00168033
EISSN: None
Source Type: Journal
DOI: 10.1190/1.2905835 Document Type: Article |
Times cited : (39)
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References (19)
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