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Volumn 73, Issue 3, 2008, Pages

Incorporating topography into 2D resistivity modeling using finite-element and finite-difference approaches

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; FINITE DIFFERENCE METHOD; FINITE ELEMENT METHOD; POISSON EQUATION; TOPOGRAPHY;

EID: 43549110278     PISSN: 00168033     EISSN: None     Source Type: Journal    
DOI: 10.1190/1.2905835     Document Type: Article
Times cited : (39)

References (19)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.