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Volumn 354, Issue 28, 2008, Pages 3260-3266
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Structural transformation on Se0.8Te0.2 chalcogenide glass
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Author keywords
Alloys; Amorphous semiconductors; Calorimetry; Chalcogenides; Crystallization; Glass transition; Long range order; SEM S100; Short range order; X ray diffraction
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Indexed keywords
AMORPHOUS SEMICONDUCTORS;
CHALCOGENIDES;
CRYSTALLITE SIZE;
CRYSTALLIZATION;
DIFFERENTIAL SCANNING CALORIMETRY;
GLASS;
GLASS TRANSITION;
SCANNING ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
CHALCOGENIDE GLASS;
LONG RANGE ORDER;
SHORT RANGE ORDER;
STRUCTURAL TRANSFORMATION;
SELENIUM COMPOUNDS;
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EID: 43549083463
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2008.02.011 Document Type: Article |
Times cited : (15)
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References (40)
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