Thermal stress effects of the diode-end-pumped Nd:YLF slab

Optics Communications

Volumn 281, Issue 13, 2008, Pages 3522-3526

  Ma, Zhe ^a   Gao, Jiancun ^a   Li, Daijun ^b   Li, Junlin ^a   Wu, Nianle ^a   Du, Keming ^b  

^a TSINGHUA UNIVERSITY   (China)

^b EdgeWave GmbH   (Germany)

Author keywords

Diode pumped lasers; Nd:YLF; Thermal stress

Indexed keywords

FINITE ELEMENT METHOD; FRACTURE; MATHEMATICAL MODELS; NEODYMIUM; THERMAL STRESS; THREE DIMENSIONAL;

DIODE-PUMPED LASERS; LASER CRYSTALS; NUMERICAL SOLUTIONS; PUMP BEAM;

SEMICONDUCTOR LASERS;

EID: 43449131521     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2008.03.012     Document Type: Article

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