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Volumn 17, Issue 3, 2008, Pages 267-284
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Entry mode research: Past and future
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Author keywords
Future research; International entry mode; Review
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Indexed keywords
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EID: 43449126198
PISSN: 09695931
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ibusrev.2008.01.003 Document Type: Article |
Times cited : (338)
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References (155)
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