Dark current measurements in a CMOS imager

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6816, Issue , 2008, Pages

  Porter, William C ^a   Kopp, Bradley ^a   Dunlap, Justin C ^a   Widenhorn, Ralf ^a   Bodegom, Erik ^a  

^a Digital Clarity Consultants ^*  (United States)

Author keywords

CMOS; Dark current; Digital images; Image correction

Indexed keywords

DARK CURRENT; DIGITAL IMAGES; IMAGE CORRECTION;

CMOS INTEGRATED CIRCUITS; IMAGE PROCESSING; PIXELS; TEMPERATURE DISTRIBUTION;

IMAGE SENSORS;

EID: 43449084969     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.769079     Document Type: Conference Paper

References (19)