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Applied Physics Letters

Volumn 50, Issue 20, 1987, Pages 1415-1416

Effect of hydrogen on electromigration and 1/f noise in gold films

(3) Rodbell, K P a Ficalora, P J a Koch, Roger b

a RENSSELAER POLYTECHNIC INSTITUTE (United States)

b IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4344706260 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.97839 Document Type: Article

Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.