Schottky barrier height measurement of swift heavy ion intermixed Ni-Silicide interface

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 225, Issue 3, 2004, Pages 256-260

  Sisodia, Veenu ^a   Kabiraj, D ^b   Jain, I P ^a  

^a UNIVERSITY OF RAJASTHAN   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

Author keywords

I V curves; Interface; Irradiation; Swift heavy ions

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; HEAVY IONS; INTERFACES (MATERIALS); ION BOMBARDMENT; MORPHOLOGY; NICKEL; SILICON COMPOUNDS;

I-V CURVES; ROOM TEMPERATURE (RT); SWIFT HEAVY IONS;

ION BEAMS;

EID: 4344703532     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.04.167     Document Type: Article

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