Vacuum chamber surface electronic properties influencing electron cloud phenomena

Applied Surface Science

Volumn 235, Issue 1-2, 2004, Pages 231-235

  Cimino, R ^a,b   Collins, I R ^a  

^a CERN   (Switzerland)

^b INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DAMPING; ELECTRONS; PROTONS; RELIABILITY; SECONDARY EMISSION; VACUUM APPLICATIONS;

BEAM DYNAMICS; COLLECTIVE INSTABILITIES; ELECTRON IMPACT; VACUUM CHAMBERS;

SURFACE PHENOMENA;

EID: 4344702153     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.270     Document Type: Conference Paper

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