Electronic properties for the C 2v and C s isomers of Pr@C 82 studied by Raman, resistivity and scanning tunneling microscopy/spectroscopy

Chemical Physics Letters

Volumn 395, Issue 1-3, 2004, Pages 78-81

  Hosokawa, Tomoko ^a,b   Fujiki, Satoshi ^a,b,c   Kuwahara, Eiji ^a,b   Kubozono, Yoshihiro ^a,b,d   Kitagawa, Hiroshi ^e   Fujiwara, Akihiko ^b,f   Takenobu, Taishi ^b,g   Iwasa, Yoshihiro ^b,g  

^a OKAYAMA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c GRADUATE UNIVERSITY FOR ADVANCED STUDIES   (Japan)

^d UNIVERSITY OF TSUKUBA   (Japan)

^e KYUSHU UNIVERSITY   (Japan)

^f JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^g TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

PRASEODYMIUM;

ANALYTIC METHOD; ARTICLE; ATOM; CHEMICAL STRUCTURE; ELECTRIC POTENTIAL; ELECTRONICS; ENERGY; ISOMER; MEASUREMENT; RAMAN SPECTROMETRY; SCANNING TUNNELING MICROSCOPY; SCANNING TUNNELING SPECTROSCOPY; SEMICONDUCTOR; SPECTROSCOPY; STRUCTURE ANALYSIS;

EID: 4344698256     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2004.07.072     Document Type: Article

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