Characterizaton of pulsed laser deposited SmFeO3 morphology: Effect of fluence, substrate temperature and oxygen pressure

Applied Physics A: Materials Science and Processing

Volumn 79, Issue 4-6, 2004, Pages 1399-1403

  Dahoo, P R ^a   Girard, A ^b   Dumond, Y ^a   Tessier, M ^a   Keller, N ^a   Guyot, M ^a  

^a Centre National de la Recherche Scientifique   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; SPECTROSCOPIC ANALYSIS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

BRUGGEMANN EFFECTIVE MEDIUM APPROXIMATION (BEMA); FRESNEL REFLECTION COEFFICIENTS (FRC); SPECTROSCOPIC ELLIPSOMETRY (SE);

PULSED LASER DEPOSITION;

EID: 4344692092     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-2792-x     Document Type: Conference Paper

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